I have sent in the file this morning.

Can I ask you to recreate the situation that you describe where our software detects a fault and then use the (Help > Create problem report) feature and email the resulting ZIP file from your desktop to [email protected] for analysis.

I will try to do that this week.

The algorithm for testing 74*393 devices appears to have a bug. I have two different batches of new 74LS393 devices and they all failed the vector test in the same way. (And they work just fine in circuit.)

I know that this is not a killer feature, but it would be nice if this could be corrected.